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  <titleInfo>
    <title>Accuracy in trace analysis</title>
    <subTitle>Sampling, sample handling, analysis</subTitle>
  </titleInfo>
  <name type="personal">
    <namePart>LaFleur, Philip D (Ed.)</namePart>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">Washington</placeTerm>
    </place>
    <publisher>National Bureau of Standards</publisher>
    <dateIssued>1976</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <language>
    <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
  </language>
  <physicalDescription>
    <form authority="marcform">print</form>
    <extent>xiii, 658p.</extent>
  </physicalDescription>
  <note type="statement of responsibility">/ Proceedings of the 7th materials research symposium held at National Bureau of Standards 7-11 October, 1974</note>
  <note>Vol. I</note>
  <subject>
    <topic>Proceedings</topic>
  </subject>
  <classification authority="udc">006.02:543.05/.06](082.2) L6.1</classification>
  <recordInfo>
    <recordContentSource authority="marcorg">National Science Library</recordContentSource>
    <recordCreationDate encoding="marc">230712</recordCreationDate>
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