Advances in x-ray analysis  

 - New York:   Plenum Press,   1982 
 - xvii, 473p.  
<br/><br/> Vol. 26 1982 
<br/><br/><label>ISBN: </label>0-306-41370-1 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Science 
<br/><br/><label>Subjects--Index Terms: </label>Information technology