Advances in x-ray analysis  

 - New York:   Plenum Press,   1973 
 - xii, 410p.  
<br/><br/> Vol. 16 1973 
<br/><br/><label>ISBN: </label>0-306-38116-8 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Science 
<br/><br/><label>Subjects--Index Terms: </label>Information technology  
<br/><br/><label>Universal Decimal Class. No.: </label>543.422.8(082.2)