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Measurement of minority carrier lifetimes in semiconductors

By:

Nishina, Yuichiro

Contributor(s):

Danielson, G C

Material type: Text

Text

TextPublication details: Iowa: Ames Laboratory, 1957Description: iv, 35pSubject(s):

Report

Item type: Reports

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Holdings
Item type	Current library	Call number	Status	Barcode
Reports	National Science Library	537.311.33 J7 (Browse shelf(Opens below))	Available	11360

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